ITU

Dependency bugs: the dark side of variability, reuse and modularity

Research output: Other contributionResearch

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Dependency bugs: the dark side of variability, reuse and modularity. / Wasowski, Andrzej.

2 p. Association for Computing Machinery. 2020, Invited talk. (International Working Conference on Variability Modelling of Software-Intensive Systems (VAMOS)).

Research output: Other contributionResearch

Harvard

APA

Wasowski, A. (2020). Dependency bugs: the dark side of variability, reuse and modularity. Association for Computing Machinery. International Working Conference on Variability Modelling of Software-Intensive Systems (VAMOS) https://doi.org/10.1145/3377024.3377712

Vancouver

Author

Wasowski, Andrzej. / Dependency bugs: the dark side of variability, reuse and modularity. 2020. Association for Computing Machinery. 2 p. (International Working Conference on Variability Modelling of Software-Intensive Systems (VAMOS)).

Bibtex

@misc{018b376464ce4b128c599e588e3ef3ba,
title = "Dependency bugs: the dark side of variability, reuse and modularity",
author = "Andrzej Wasowski",
year = "2020",
doi = "10.1145/3377024.3377712",
language = "English",
series = "International Working Conference on Variability Modelling of Software-Intensive Systems (VAMOS)",
publisher = "Association for Computing Machinery",
address = "United States",
type = "Other",

}

RIS

TY - GEN

T1 - Dependency bugs: the dark side of variability, reuse and modularity

AU - Wasowski, Andrzej

PY - 2020

Y1 - 2020

U2 - 10.1145/3377024.3377712

DO - 10.1145/3377024.3377712

M3 - Other contribution

T3 - International Working Conference on Variability Modelling of Software-Intensive Systems (VAMOS)

PB - Association for Computing Machinery

ER -

ID: 85661170