Understanding metric-related pitfalls in image analysis validation

Annika Reinke, Lena Maier-Hein, Minu Dietlinde Tizabi, Veronika Cheplygina

Research output: Journal Article or Conference Article in JournalJournal articleResearchpeer-review

Fingerprint

Dive into the research topics of 'Understanding metric-related pitfalls in image analysis validation'. Together they form a unique fingerprint.

Keyphrases

Computer Science

Earth and Planetary Sciences

Psychology