CVL: common variability language

Øystein Haugen; Andrzej Wasowski; Krzysztof Czarnecki

doi:10.1145/2364412.2364462

CVL: common variability language

Øystein Haugen
, Andrzej Wasowski
, Krzysztof Czarnecki

Applied research, technology and innovation
University of Waterloo

Research output: Conference Article in Proceeding or Book/Report chapter › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	16th International Software Product Line Conference, SPLC'12, Salvador, Brazil - September 2-7, 2012, Volume 2
Volume	2
Publisher	Association for Computing Machinery
Publication date	2012
Pages	266-267
ISBN (Print)	978-1-4503-1095-6
DOIs	https://doi.org/10.1145/2364412.2364462
Publication status	Published - 2012

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10.1145/2364412.2364462

VARIES: VARiability In safety critical Embedded Systems
Wasowski, A. (PI), Berger, T. (CoI), Iosif-Lazăr, A. F. (CoI), Mukkamala, R. R. (CoI), Dimovski, A. (CoI) & Østerbye, K. (CoI)
Innovation Fund Denmark, European Commission
01/05/2013 → 30/04/2015
Project: Research

Cite this

@inproceedings{d979f2cad21f45a2bc7e1a1cdd78e263,

title = "CVL: common variability language",

author = "{\O}ystein Haugen and Andrzej Wasowski and Krzysztof Czarnecki",

year = "2012",

doi = "10.1145/2364412.2364462",

language = "English",

isbn = "978-1-4503-1095-6 ",

volume = "2",

pages = " 266--267",

booktitle = "16th International Software Product Line Conference, SPLC'12, Salvador, Brazil - September 2-7, 2012, Volume 2",

publisher = "Association for Computing Machinery",

address = "United States",

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CVL: common variability language. / Haugen, Øystein; Wasowski, Andrzej; Czarnecki, Krzysztof.
16th International Software Product Line Conference, SPLC'12, Salvador, Brazil - September 2-7, 2012, Volume 2. Vol. 2 Association for Computing Machinery, 2012. p. 266-267.

Research output: Conference Article in Proceeding or Book/Report chapter › Article in proceedings › Research › peer-review

TY - GEN

T1 - CVL: common variability language

AU - Haugen, Øystein

AU - Wasowski, Andrzej

AU - Czarnecki, Krzysztof

PY - 2012

Y1 - 2012

U2 - 10.1145/2364412.2364462

DO - 10.1145/2364412.2364462

M3 - Article in proceedings

SN - 978-1-4503-1095-6

VL - 2

SP - 266

EP - 267

BT - 16th International Software Product Line Conference, SPLC'12, Salvador, Brazil - September 2-7, 2012, Volume 2

PB - Association for Computing Machinery

ER -

CVL: common variability language

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Projects

VARIES: VARiability In safety critical Embedded Systems

Cite this