CVL: common variability language

Øystein Haugen; Andrzej Wasowski; Krzysztof Czarnecki

doi:10.1145/2491627.2493899

CVL: common variability language

Øystein Haugen, Andrzej Wasowski, Krzysztof Czarnecki

Research output: Conference Article in Proceeding or Book/Report chapter › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	17th International Software Product Line Conference, SPLC 2013, Tokyo, Japan - August 26 - 30, 2013
Number of pages	1
Publisher	Association for Computing Machinery
Publication date	2013
Pages	277
ISBN (Electronic)	978-1-4503-1968-3
DOIs	https://doi.org/10.1145/2491627.2493899
Publication status	Published - 2013

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10.1145/2491627.2493899

VARIES: VARiability In safety critical Embedded Systems
Wasowski, A. (PI), Berger, T. (CoI), Iosif-Lazăr, A. F. (CoI), Mukkamala, R. R. (CoI), Dimovski, A. (CoI) & Østerbye, K. (CoI)
IFD - Innovation Fund Denmark, European Commission
01/05/2013 → 30/04/2015
Project: Research

Cite this

@inproceedings{76c28385c2064cf090a4cb6ea4653c9b,

title = "CVL: common variability language",

author = "{\O}ystein Haugen and Andrzej Wasowski and Krzysztof Czarnecki",

year = "2013",

doi = "10.1145/2491627.2493899",

language = "English",

pages = "277",

booktitle = "17th International Software Product Line Conference, SPLC 2013, Tokyo, Japan - August 26 - 30, 2013",

publisher = "Association for Computing Machinery",

address = "United States",

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CVL: common variability language. / Haugen, Øystein; Wasowski, Andrzej; Czarnecki, Krzysztof.
17th International Software Product Line Conference, SPLC 2013, Tokyo, Japan - August 26 - 30, 2013. Association for Computing Machinery, 2013. p. 277.

Research output: Conference Article in Proceeding or Book/Report chapter › Article in proceedings › Research › peer-review

TY - GEN

T1 - CVL: common variability language

AU - Haugen, Øystein

AU - Wasowski, Andrzej

AU - Czarnecki, Krzysztof

PY - 2013

Y1 - 2013

U2 - 10.1145/2491627.2493899

DO - 10.1145/2491627.2493899

M3 - Article in proceedings

SP - 277

BT - 17th International Software Product Line Conference, SPLC 2013, Tokyo, Japan - August 26 - 30, 2013

PB - Association for Computing Machinery

ER -

CVL: common variability language

Access to Document

Projects

VARIES: VARiability In safety critical Embedded Systems

Cite this