Example-driven modeling: model = abstractions + examples

Kacper Bak; Dina Zayan; Krzysztof Czarnecki; Michal Antkiewicz; Zinovy Diskin; Andrzej Wasowski; Derek Rayside

doi:10.1109/ICSE.2013.6606696

Example-driven modeling: model = abstractions + examples

Kacper Bak, Dina Zayan, Krzysztof Czarnecki, Michal Antkiewicz, Zinovy Diskin, Andrzej Wasowski, Derek Rayside

Computer Science

Publikation: Konference artikel i Proceeding eller bog/rapport kapitel › Konferencebidrag i proceedings › Forskning › peer review

Originalsprog	Engelsk
Titel	35th International Conference on Software Engineering, ICSE '13, San Francisco, CA, USA, May 18-26, 2013
Antal sider	4
Forlag	IEEE Press
Publikationsdato	2013
Sider	1273-1276
ISBN (Elektronisk)	978-1-4673-3076-3
DOI	https://doi.org/10.1109/ICSE.2013.6606696
Status	Udgivet - 2013

Adgang til dokumentet

10.1109/ICSE.2013.6606696

http://dl.acm.org/citation.cfm?id=2486982

Citationsformater

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title = "Example-driven modeling: model = abstractions + examples",

author = "Kacper Bak and Dina Zayan and Krzysztof Czarnecki and Michal Antkiewicz and Zinovy Diskin and Andrzej Wasowski and Derek Rayside",

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Example-driven modeling: model = abstractions + examples. / Bak, Kacper; Zayan, Dina; Czarnecki, Krzysztof et al.
35th International Conference on Software Engineering, ICSE '13, San Francisco, CA, USA, May 18-26, 2013. IEEE Press, 2013. s. 1273-1276.

Publikation: Konference artikel i Proceeding eller bog/rapport kapitel › Konferencebidrag i proceedings › Forskning › peer review

TY - GEN

T1 - Example-driven modeling: model = abstractions + examples

AU - Bak, Kacper

AU - Zayan, Dina

AU - Czarnecki, Krzysztof

AU - Antkiewicz, Michal

AU - Diskin, Zinovy

AU - Wasowski, Andrzej

AU - Rayside, Derek

N1 - Missing ISBN 21.01.2014 haal

PY - 2013

Y1 - 2013

U2 - 10.1109/ICSE.2013.6606696

DO - 10.1109/ICSE.2013.6606696

M3 - Article in proceedings

SP - 1273

EP - 1276

BT - 35th International Conference on Software Engineering, ICSE '13, San Francisco, CA, USA, May 18-26, 2013

PB - IEEE Press

ER -